K. Yacine
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- [j1]K. Yacine, F. Flourens, D. Bourrier, L. Salvagnac, P. Calmont, Xavier Lafontan, Q.-H. Duong, Lionel Buchaillot, D. Peyrou, Patrick Pons:
Biaxial initial stress characterization of bilayer gold RF-switches. Microelectronics Reliability 45(9-11): 1776-1781 (2005)
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last updated on 2018-03-07 10:42 CET by the dblp team