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Semantic Scholarrecord journals/et/HamdiouiG00
Said Hamdioui, A. J. van de Goor:
Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy. J. Electronic Testing 16(5): 487-498 (2000)
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last updated on 2017-05-18 09:51 CEST by the dblp team