We are gradually moving the dblp web pages to HTTPS, and you are still viewing this page via HTTP.
Please click here to switch to HTTPS.
default search action
combined dblp search
author search
venue search
publication search
Semantic Scholar search
Authors:
no matches
Venues:
no matches
Publications:
no matches
ask others
Google
Google Scholar
MS Academic
CiteSeerX
CORE
Semantic Scholar
record journals/et/HamdiouiG00
Trier 2
Trier 1
Dagstuhl
>
Home
view
electronic edition via DOI
export record
BibTeX
RIS
RDF N-Triples
RDF/XML
XML
dblp key:
journals/et/HamdiouiG00
ask others
Google
Google Scholar
MS Academic
CiteSeerX
CORE
Semantic Scholar
share record
Twitter
Reddit
Mendeley
BibSonomy
LinkedIn
Google+
Facebook
short URL:
https://dblp.org/rec/journals/et/HamdiouiG00
Said Hamdioui
,
A. J. van de Goor
:
Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy.
J. Electronic Testing
16
(
5
)
:
487-498
(
2000
)
maintained by
at
home
news
statistics
browse
persons
conferences
journals
series
search
search dblp
lookup by ID
about
f.a.q.
team
legal bits