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Mayank Shrivastava

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2018
[c13]
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  - conf/irps/KranthiMMVS18
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Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava:
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. IRPS 2018: 3
[c12]
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Milova Paul, B. Sampath Kumar, Harald Gossner, Mayank Shrivastava:
Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability. IRPS 2018: 3
[c11]
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  - conf/irps/SinhaBSS18
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Rajat Sinha, Prasenjit Bhattacharya, Sanjiv Sambandan, Mayank Shrivastava:
On the ESD behavior of a-Si: H based thin film transistors: Physical insights, design and technological implications. IRPS 2018: 3
[c10]
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  - conf/irps/ShankarSGS18
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Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, Mayank Shrivastava:
Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs. IRPS 2018: 4
[c9]
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  - conf/irps/ShankarSGSKMRS18
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Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, R. Sengupta, H. Khand, N. Mohan, Srinivasan Raghavan, Mayank Shrivastava:
On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs. IRPS 2018: 4
[c8]
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  - conf/sigmod/ImGSSTJDLPLA18
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Jean-François Im, Kishore Gopalakrishna, Subbu Subramaniam, Mayank Shrivastava, Adwait Tumbde, Xiaotian Jiang, Jennifer Dai, Seunghyun Lee, Neha Pawar, Jialiang Li, Ravi Aringunram:
Pinot: Realtime OLAP for 530 Million Users. SIGMOD Conference 2018: 583-594
[c7]
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Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Mayank Shrivastava:
On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes. VLSI Design 2018: 469-470
2017
[c6]
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Bhawani Shankar, Ankit Soni, Manikant Singh, Rohith Soman, K. N. Bhat, Srinivasan Raghavan, Navakanta Bhat, Mayank Shrivastava:
ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis. VLSI Design 2017: 361-365
[c5]
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  - conf/vlsid/PaulRKGS17
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Milova Paul, Christian Russ, B. Sampath Kumar, Harald Gossner, Mayank Shrivastava:
Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete? VLSI Design 2017: 391-394
[c4]
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  - conf/vlsid/MeershaSS17
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Adil Meersha, B. Sathyajit, Mayank Shrivastava:
A Systematic Study on the Hysteresis Behaviour and Reliability of MoS2 FET. VLSI Design 2017: 437-440
2016
[c3]
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  - conf/vlsid/GuptaSBGR16
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Ankur Gupta, Mayank Shrivastava, Maryam Shojaei Baghini, Harald Gossner, V. Ramgopal Rao:
A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package. VLSI Design 2016: 156-161
2015
[c2]
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  - conf/dsaa/ShrivastavaNS15
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Mayank Shrivastava, Maitreya Natu, Vaishali P. Sadaphal:
Towards predictable and risk-free enterprise systems. DSAA 2015: 1-7
2011
[c1]
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  - conf/www/AjmeraJMRSSS11
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Jitendra Ajmera, Anupam Joshi, Sougata Mukherjea, Nitendra Rajput, Shrey Sahay, Mayank Shrivastava, Kundan Srivastava:
Two-stream indexing for spoken web search. WWW (Companion Volume) 2011: 503-512

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