Mayank Shrivastava
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2010 – today
- 2018
- [c13]Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava:
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. IRPS 2018: 3 - [c12]Milova Paul, B. Sampath Kumar, Harald Gossner, Mayank Shrivastava:
Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability. IRPS 2018: 3 - [c11]Rajat Sinha, Prasenjit Bhattacharya, Sanjiv Sambandan, Mayank Shrivastava:
On the ESD behavior of a-Si: H based thin film transistors: Physical insights, design and technological implications. IRPS 2018: 3 - [c10]Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, Mayank Shrivastava:
Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs. IRPS 2018: 4 - [c9]Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, R. Sengupta, H. Khand, N. Mohan, Srinivasan Raghavan, Mayank Shrivastava:
On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs. IRPS 2018: 4 - [c8]Jean-François Im, Kishore Gopalakrishna, Subbu Subramaniam, Mayank Shrivastava, Adwait Tumbde, Xiaotian Jiang, Jennifer Dai, Seunghyun Lee, Neha Pawar, Jialiang Li, Ravi Aringunram:
Pinot: Realtime OLAP for 530 Million Users. SIGMOD Conference 2018: 583-594 - [c7]Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Mayank Shrivastava:
On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes. VLSI Design 2018: 469-470 - 2017
- [c6]Bhawani Shankar, Ankit Soni, Manikant Singh, Rohith Soman, K. N. Bhat, Srinivasan Raghavan, Navakanta Bhat, Mayank Shrivastava:
ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis. VLSI Design 2017: 361-365 - [c5]Milova Paul, Christian Russ, B. Sampath Kumar, Harald Gossner, Mayank Shrivastava:
Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete? VLSI Design 2017: 391-394 - [c4]Adil Meersha, B. Sathyajit, Mayank Shrivastava:
A Systematic Study on the Hysteresis Behaviour and Reliability of MoS2 FET. VLSI Design 2017: 437-440 - 2016
- [c3]Ankur Gupta, Mayank Shrivastava, Maryam Shojaei Baghini, Harald Gossner, V. Ramgopal Rao:
A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package. VLSI Design 2016: 156-161 - 2015
- [c2]Mayank Shrivastava, Maitreya Natu, Vaishali P. Sadaphal:
Towards predictable and risk-free enterprise systems. DSAA 2015: 1-7 - 2011
- [c1]Jitendra Ajmera, Anupam Joshi, Sougata Mukherjea, Nitendra Rajput, Shrey Sahay, Mayank Shrivastava, Kundan Srivastava:
Two-stream indexing for spoken web search. WWW (Companion Volume) 2011: 503-512
Coauthor Index
last updated on 2019-01-23 20:35 CET by the dblp team
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