BibTeX record conf/ats/BiswasSJMPS05

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@inproceedings{DBLP:conf/ats/BiswasSJMPS05,
  author    = {Santosh Biswas and
               P. Srikanth and
               R. Jha and
               Siddhartha Mukhopadhyay and
               Amit Patra and
               Dipankar Sarkar},
  title     = {On-Line Testing of Digital Circuits for n-Detect and Bridging Fault
               Models},
  booktitle = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
               India},
  pages     = {88--93},
  year      = {2005},
  crossref  = {DBLP:conf/ats/2005},
  url       = {https://doi.org/10.1109/ATS.2005.85},
  doi       = {10.1109/ATS.2005.85},
  timestamp = {Thu, 25 May 2017 00:41:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/BiswasSJMPS05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2005,
  title     = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
               India},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=10525},
  isbn      = {0-7695-2481-8},
  timestamp = {Thu, 14 Jan 2016 10:13:58 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2005},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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