BibTeX record journals/mr/KimCJLML04

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@article{DBLP:journals/mr/KimCJLML04,
  author    = {Y. H. Kim and
               R. Choi and
               R. Jha and
               J. H. Lee and
               V. Misra and
               J. C. Lee},
  title     = {Reliability of High-K Dielectrics and Its Dependence on Gate Electrode
               and Interfacial / High-K Bi-Layer Structure},
  journal   = {Microelectronics Reliability},
  volume    = {44},
  number    = {9-11},
  pages     = {1513--1518},
  year      = {2004},
  url       = {https://doi.org/10.1016/j.microrel.2004.07.049},
  doi       = {10.1016/j.microrel.2004.07.049},
  timestamp = {Sun, 28 May 2017 13:23:37 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/KimCJLML04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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