BibTeX record journals/qre/ChaP16

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@article{DBLP:journals/qre/ChaP16,
  author    = {Ji Hwan Cha and
               Gianpaolo Pulcini},
  title     = {A Dependent Competing Risks Model for Technological Units Subject
               to Degradation Phenomena and Catastrophic Failures},
  journal   = {Quality and Reliability Eng. Int.},
  volume    = {32},
  number    = {2},
  pages     = {505--517},
  year      = {2016},
  url       = {https://doi.org/10.1002/qre.1767},
  doi       = {10.1002/qre.1767},
  timestamp = {Sat, 24 Nov 2018 11:58:53 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/qre/ChaP16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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